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LT-021969 / first seen 2026-09-14 15:28 / last activity 1h ago

Imaging topological polar structures in marginally twisted 2D semiconductors

measurement

heat
45 / 100 (raw 1.2)
velocity
0.0 independent sources per hour
solidity
80 / 100
sources
1 total, 1 independent
domain span
1 domain covered it

primary source

title
Imaging topological polar structures in marginally twisted 2D semiconductors
venue
status
peer-reviewed
doi
10.1126/sciadv.aed8555
published
2026-09-11

media coverage / 1 outlets