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LT-029299 / first seen 2026-10-06 23:26 / last activity 1h ago

Depth-Resolved X-Ray Nanoimaging of Coherent and Incoherent Energy Transport in Silicon Carbide

measurement

heat
45 / 100 (raw 1.2)
velocity
0.0 independent sources per hour
solidity
80 / 100
sources
1 total, 1 independent
domain span
1 domain covered it

primary source

title
Depth-Resolved X-Ray Nanoimaging of Coherent and Incoherent Energy Transport in Silicon Carbide
venue
status
peer-reviewed
doi
10.1021/acsnano.5c20241
published
2026-04-20

media coverage / 1 outlets